Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10068814 | Apparatus and method for evaluating semiconductor device comprising thermal image processing | Norihiro Takesako, Hajime Akiyama | 2018-09-04 |
| 9995786 | Apparatus and method for evaluating semiconductor device | Norihiro Takesako, Hajime Akiyama | 2018-06-12 |
| 9974184 | Printed board, electronic device, and method for manufacturing electronic device | Mitsuaki Hayashi, Osamu Saito, Junichi Hayama | 2018-05-15 |
| 9880196 | Semiconductor device inspection apparatus and semiconductor device inspection method | Hajime Akiyama | 2018-01-30 |