Issued Patents 2018
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10156526 | Method for reviewing defects | Yung-Teng Tsai, Hung-Chin Lin, Chia-Chen Sun, Jun Chen, Chung-Chih Hung +1 more | 2018-12-18 |
| 10141362 | Semiconductor device having protection layer wrapping around conductive structure | Chih-Wei Sung, Yi-Hung Chen, Keng-Ying Liao, Yi Yang | 2018-11-27 |
| 10082471 | Semiconductor structure and method for reviewing defects | Yung-Teng Tsai, Hung-Chin Lin, Chia-Chen Sun, Jun Chen, Chung-Chih Hung +1 more | 2018-09-25 |
| 10035875 | Patterned film structure, patterned film composite structure, method of selective inhibition of formation of organic film and method of selective adjustment of thickness of organic film | Hsien-Yeh Chen | 2018-07-31 |
| 9929203 | Semiconductor device and method for fabricating thereof | Chih-Wei Sung, Yi-Hung Chen, Keng-Ying Liao, Yi Yang | 2018-03-27 |