Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10156526 | Method for reviewing defects | Yung-Teng Tsai, Hung-Chin Lin, Chih-Yu Wu, Jun Chen, Chung-Chih Hung +1 more | 2018-12-18 |
| 10082471 | Semiconductor structure and method for reviewing defects | Yung-Teng Tsai, Hung-Chin Lin, Chih-Yu Wu, Jun Chen, Chung-Chih Hung +1 more | 2018-09-25 |