Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10037726 | Detecting method of substandard state and display module and electronic device operating the same | Joon-Gyu Lee | 2018-07-31 |
| 9927224 | Thickness measuring apparatus and thickness measuring method | Jong-Ahn Kim, Jae Yong Lee, Jae-Heun Woo | 2018-03-27 |
| 9921051 | Thickness measuring apparatus and thickness measuring method | Jong-Ahn Kim, Chu-Shik Kang, Jong-Han Jin | 2018-03-20 |