Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9927224 | Thickness measuring apparatus and thickness measuring method | Jae Wan Kim, Jae Yong Lee, Jae-Heun Woo | 2018-03-27 |
| 9921051 | Thickness measuring apparatus and thickness measuring method | Jae Wan Kim, Chu-Shik Kang, Jong-Han Jin | 2018-03-20 |