JW

Jae-Heun Woo

KS Korea Research Institute Of Standards And Science: 1 patents #13 of 65Top 20%
Overall (2018): #379,153 of 503,207Top 80%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9927224 Thickness measuring apparatus and thickness measuring method Jong-Ahn Kim, Jae Wan Kim, Jae Yong Lee 2018-03-27