Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9972959 | Semiconductor inspection and metrology system using laser pulse multiplier | Yung-Ho Alex Chuang, J. Joseph Armstrong, Justin Dianhuan Liou, David L. Brown | 2018-05-15 |
| 9935421 | 193nm laser and inspection system | Yung-Ho Alex Chuang, J. Joseph Armstrong, Yujun Deng, Justin Dianhuan Liou, John Fielden | 2018-04-03 |