Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10157457 | Optical measurement of opening dimensions in a wafer | James Jianguo Xu, Ken Kinsun Lee, Nitigya Kathuria | 2018-12-18 |
| 10094787 | Multi-surface specular reflection inspector | Steven W. Meeks, Rusmin Kudinar, Hung Phi Nguyen | 2018-10-09 |
| 10048480 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Hung Phi Nguyen, Zhen Hou | 2018-08-14 |
| 9921169 | Method of detecting defect location using multi-surface specular reflection | Steven W. Meeks, Rusmin Kudinar, Hung Phi Nguyen | 2018-03-20 |