Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10157457 | Optical measurement of opening dimensions in a wafer | Ronny Soetarman, Ken Kinsun Lee, Nitigya Kathuria | 2018-12-18 |
| 10048480 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou | 2018-08-14 |