Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10094787 | Multi-surface specular reflection inspector | Steven W. Meeks, Rusmin Kudinar, Ronny Soetarman | 2018-10-09 |
| 10048480 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Zhen Hou | 2018-08-14 |
| 9921169 | Method of detecting defect location using multi-surface specular reflection | Steven W. Meeks, Rusmin Kudinar, Ronny Soetarman | 2018-03-20 |