Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10088345 | Haze and defect distribution and aperture configuration in surface metrology inspectors | Chuanyong Huang, Raymond Chu, Dieter Wilk, Christian Wolters, Tim Mahatdejkul | 2018-10-02 |