WL

Wei Ti Lee

NI Nova Measuring Instruments: 2 patents #6 of 31Top 20%
Applied Materials: 1 patents #421 of 1,019Top 45%
📍 Planada, CA: #1 of 5 inventorsTop 20%
🗺 California: #7,478 of 60,411 inventorsTop 15%
Overall (2018): #52,755 of 503,207Top 15%
3
Patents 2018

Issued Patents 2018

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
10082390 Feed-forward of multi-layer and multi-process information using XPS and XRF technologies Heath A. Pois, Lawrence V. Bot, Michael Kwan, Mark Klare, Charles Thomas Larson 2018-09-25
9952166 Silicon germanium thickness and composition determination using combined XPS and XRF technologies Heath A. Pois 2018-04-24
9926639 Methods for forming barrier/seed layers for copper interconnect structures Hoon Kim, Sang Ho Yu, Seshadri Ganguli, Hyoung-Chan Ha, Sang-Hyeob Lee 2018-03-27