RK

Roman Kris

Applied Materials: 1 patents #421 of 1,019Top 45%
Overall (2018): #259,579 of 503,207Top 55%
1
Patents 2018

Issued Patents 2018

Patent #TitleCo-InventorsDate
9916652 Technique for measuring overlay between layers of a multilayer structure Yakov Weinberg, Ishai Schwarzband, Itay Zauer, Ran Goldman, Olga Novak +3 more 2018-03-13