Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10103005 | Imaging low electron yield regions with a charged beam imager | Yuval Gronau, Barak Dee-Noor | 2018-10-16 |
| 9916652 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Roman Kris, Itay Zauer, Ran Goldman, Olga Novak +3 more | 2018-03-13 |
| 9858658 | Defect classification using CAD-based context attributes | Idan Kaizerman, Efrat Rozenman | 2018-01-02 |