Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161882 | Method of examining locations in a wafer with adjustable navigation accuracy and system thereof | Mark Geshel | 2018-12-25 |
| 10114368 | Closed-loop automatic defect inspection and classification | Gadi Greenberg, Zeev Zohar | 2018-10-30 |
| 10049441 | Iterative defect filtering process | Saar Shabtay, Amir Wachs | 2018-08-14 |
| 10043264 | Integration of automatic and manual defect classification | Gadi Greenberg, Efrat Rozenman | 2018-08-07 |
| 9858658 | Defect classification using CAD-based context attributes | Ishai Schwarzband, Efrat Rozenman | 2018-01-02 |