Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161882 | Method of examining locations in a wafer with adjustable navigation accuracy and system thereof | Idan Kaizerman | 2018-12-25 |
MG
Mark Geshel
Overall (2018): #321,558 of 503,207Top 65%
1
Patents 2018