Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9916652 | Technique for measuring overlay between layers of a multilayer structure | Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman, Olga Novak +3 more | 2018-03-13 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9916652 | Technique for measuring overlay between layers of a multilayer structure | Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman, Olga Novak +3 more | 2018-03-13 |