RS

Remco Schoenmakers

FE Fei: 1 patents #23 of 107Top 25%
📍 Best, NL: #7 of 20 inventorsTop 35%
Overall (2018): #266,448 of 503,207Top 55%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9934936 Charged particle microscope with special aperture plate Pavel Potocek, Franciscus Martinus Henricus Maria van Laarhoven, Faysal Boughorbel, Peter Christiaan Tiemeijer 2018-04-03