Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9916652 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Olga Novak +3 more | 2018-03-13 |
RG
Ran Goldman
Overall (2018): #270,477 of 503,207Top 55%
1
Patents 2018