JF

Jordan Ray Fine

FE Fei: 1 patents #23 of 107Top 25%
📍 Ventura, CA: #35 of 90 inventorsTop 40%
🗺 California: #23,431 of 60,411 inventorsTop 40%
Overall (2018): #366,155 of 503,207Top 75%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10139429 Method for calibrating and imaging using multi-tip scanning probe microscope Sean Zumwalt, Anton Riley, Rohit Jain 2018-11-27