AR

Anton Riley

FE Fei: 1 patents #23 of 107Top 25%
📍 Santa Ynez, CA: #2 of 9 inventorsTop 25%
🗺 California: #23,431 of 60,411 inventorsTop 40%
Overall (2018): #485,110 of 503,207Top 100%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10139429 Method for calibrating and imaging using multi-tip scanning probe microscope Sean Zumwalt, Jordan Ray Fine, Rohit Jain 2018-11-27