Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10139429 | Method for calibrating and imaging using multi-tip scanning probe microscope | Anton Riley, Jordan Ray Fine, Rohit Jain | 2018-11-27 |
| 9869696 | Method for imaging a feature using a scanning probe microscope | Andrew Norman Erickson, Stephen Bradley Ippolito | 2018-01-16 |