Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10107860 | Bitwise rotating scan section for microelectronic chip testing and diagnostics | Todd L. Cohen, Mary P. Kusko, Timothy C. Taylor | 2018-10-23 |
| 10067183 | Portion isolation architecture for chip isolation test | Steven M. Douskey, Raghu G. Gaurav, Mary P. Kusko | 2018-09-04 |