Issued Patents 2018
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161885 | Optical phase measurement method and system | Gilad Barak, Danny Grossman, Yoav Berlatzky, Yanir Hainick | 2018-12-25 |
| 10073045 | Optical method and system for measuring isolated features of a structure | Gilad Barak, Yanir Hainick | 2018-09-11 |
| 10054423 | Optical method and system for critical dimensions and thickness characterization | Gilad Barak, Shay Wolfling | 2018-08-21 |
| 10041838 | Optical critical dimension metrology | Gilad Barak, Danny Grossman | 2018-08-07 |
| 9897553 | Optical phase measurement method and system | Gilad Barak, Yanir Hainick, Shahar Gov | 2018-02-20 |