Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161885 | Optical phase measurement method and system | Gilad Barak, Dror Shafir, Yoav Berlatzky, Yanir Hainick | 2018-12-25 |
| 10041838 | Optical critical dimension metrology | Gilad Barak, Dror Shafir | 2018-08-07 |
| 9927370 | Method and system for improving optical measurements on small targets | Guy Selickter | 2018-03-27 |