Issued Patents 2018
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161885 | Optical phase measurement method and system | Danny Grossman, Dror Shafir, Yoav Berlatzky, Yanir Hainick | 2018-12-25 |
| 10073045 | Optical method and system for measuring isolated features of a structure | Yanir Hainick, Dror Shafir | 2018-09-11 |
| 10054423 | Optical method and system for critical dimensions and thickness characterization | Dror Shafir, Shay Wolfling | 2018-08-21 |
| 10041838 | Optical critical dimension metrology | Dror Shafir, Danny Grossman | 2018-08-07 |
| 10018574 | Optical method and system for defects detection in three-dimensional structures | Elad Dotan, Alon Belleli | 2018-07-10 |
| 9897553 | Optical phase measurement method and system | Dror Shafir, Yanir Hainick, Shahar Gov | 2018-02-20 |