Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10056224 | Method and system for edge-of-wafer inspection and review | Xinrong Jiang, Christopher Sears, Harsh Sinha, David Kaz, Wei Ye | 2018-08-21 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10056224 | Method and system for edge-of-wafer inspection and review | Xinrong Jiang, Christopher Sears, Harsh Sinha, David Kaz, Wei Ye | 2018-08-21 |