Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10151987 | Measuring method, apparatus and substrate | Franciscus Godefridus Casper Bijnen, Sami Musa | 2018-12-11 |
| 9946165 | Methods and apparatus for obtaining diagnostic information relating to an industrial process | Alexander Ypma, Jasper Menger, David Han, Adrianus Cornelis Matheus Koopman, Irina Lyulina +3 more | 2018-04-17 |
| 9927717 | Inspection method and apparatus, and lithographic apparatus | Kyu Kab Rhe, Hubertus Johannes Gertrudus Simons, Thomas Theeuwes | 2018-03-27 |