Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10096447 | Electron beam apparatus with high resolutions | Xinrong Jiang | 2018-10-09 |
| 10090131 | Method and system for aberration correction in an electron beam system | Xinrong Jiang | 2018-10-02 |
| 10056224 | Method and system for edge-of-wafer inspection and review | Xinrong Jiang, Harsh Sinha, David Trease, David Kaz, Wei Ye | 2018-08-21 |
| 9934933 | Extractor electrode for electron source | Laurence S. Hordon, Nikolai Chubun, Luca Grella, Xinrong Jiang, Daniel Bui +2 more | 2018-04-03 |
| 9881764 | Heat-spreading blanking system for high throughput electron beam apparatus | Xinrong Jiang, Douglas A. Larson | 2018-01-30 |