Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9875534 | Techniques and systems for model-based critical dimension measurements | Abdurrahman Sezginer, Eric Vella, Yanwei Liu | 2018-01-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9875534 | Techniques and systems for model-based critical dimension measurements | Abdurrahman Sezginer, Eric Vella, Yanwei Liu | 2018-01-23 |