Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10121634 | Charged particle beam device and charged particle beam measurement method | Natsuki Tsuno, Hideyuki Kazumi, Hajime Kawano, Junichiro Tomizawa | 2018-11-06 |
| 9991092 | Scanning electron microscope and sample observation method | Zhaohui Cheng, Hikaru Koyama, Hiroyuki Shinada, Osamu Komuro | 2018-06-05 |