Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9991092 | Scanning electron microscope and sample observation method | Hikaru Koyama, Yoshinobu Kimura, Hiroyuki Shinada, Osamu Komuro | 2018-06-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9991092 | Scanning electron microscope and sample observation method | Hikaru Koyama, Yoshinobu Kimura, Hiroyuki Shinada, Osamu Komuro | 2018-06-05 |