Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10020163 | Charged particle beam apparatus, specimen observation system and operation program | Yayoi Konishi, Mitsugu Sato, Masaki Takano, Shotaro Tamayama, Masako Nishimura +1 more | 2018-07-10 |
| 9963776 | Charged particle device and wiring method | Yoichiro Hashimoto, Eiko Nakazawa, Shuichi Takeuchi | 2018-05-08 |