Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10020163 | Charged particle beam apparatus, specimen observation system and operation program | Yayoi Konishi, Mitsugu Sato, Masaki Takano, Shotaro Tamayama, Shunya Watanabe +1 more | 2018-07-10 |