Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10078132 | Scanning optical system and radar | Ryouta Ishikawa, Hiroyuki Matsuda, Masashi Kageyama, Junichiro Yonetake, Hideyuki Fujii | 2018-09-18 |
| 9990708 | Pattern-measuring apparatus and semiconductor-measuring system | Yasutaka Toyoda, Norio Hasegawa, Takeshi Kato, Hitoshi Sugahara, Yutaka Hojo +1 more | 2018-06-05 |
| 9869856 | Illumination device and projector | Nozomu Inoue, Akira Miyamae, Shigehiro Yanase | 2018-01-16 |
| 9858659 | Pattern inspecting and measuring device and program | Tsuyoshi Minakawa, Takashi Hiroi, Takeyuki Yoshida, Taku Ninomiya, Takuma Yamamoto +3 more | 2018-01-02 |