Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9990708 | Pattern-measuring apparatus and semiconductor-measuring system | Norio Hasegawa, Takeshi Kato, Hitoshi Sugahara, Yutaka Hojo, Daisuke Hibino +1 more | 2018-06-05 |
| 9858659 | Pattern inspecting and measuring device and program | Tsuyoshi Minakawa, Takashi Hiroi, Takeyuki Yoshida, Taku Ninomiya, Takuma Yamamoto +3 more | 2018-01-02 |