Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9990708 | Pattern-measuring apparatus and semiconductor-measuring system | Yasutaka Toyoda, Takeshi Kato, Hitoshi Sugahara, Yutaka Hojo, Daisuke Hibino +1 more | 2018-06-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9990708 | Pattern-measuring apparatus and semiconductor-measuring system | Yasutaka Toyoda, Takeshi Kato, Hitoshi Sugahara, Yutaka Hojo, Daisuke Hibino +1 more | 2018-06-05 |