Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10140400 | Method and system for defect prediction of integrated circuits | Jie Lin, Zhaoli Zhang | 2018-11-27 |
| 10133838 | Guided defect detection of integrated circuits | Hua-Yu Liu, Jie Lin, Zhaoli Zhang | 2018-11-20 |