Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10140400 | Method and system for defect prediction of integrated circuits | Zongchang Yu, Jie Lin | 2018-11-27 |
| 10133838 | Guided defect detection of integrated circuits | Hua-Yu Liu, Jie Lin, Zongchang Yu | 2018-11-20 |
| 9928446 | Augmented automatic defect classification | Weimin Ma, Xiaomei Wu | 2018-03-27 |