Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10147178 | Method of recognizing wafer | — | 2018-12-04 |
| 10102619 | Inspection method and system | Zhao-Li Zhang, Jack Jau | 2018-10-16 |
| 9965844 | Inspection method and system | Zhao-Li Zhang, Jack Jau | 2018-05-08 |
| 9953803 | Local alignment point calibration method in die inspection | Kevin Liu, Fei Wang, Jack Jau | 2018-04-24 |