FW

Fei Wang

HM Hermes Microvision: 1 patents #14 of 18Top 80%
Overall (2018): #420,783 of 503,207Top 85%
1
Patents 2018

Issued Patents 2018

Patent #TitleCo-InventorsDate
9953803 Local alignment point calibration method in die inspection Wei Fang, Kevin Liu, Jack Jau 2018-04-24