Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10008384 | Techniques to engineer nanoscale patterned features using ions | Simon Ruffell, John Hautala, Adam Brand | 2018-06-26 |
| 9984889 | Techniques for manipulating patterned features using ions | Simon Ruffell, Jun Lang, John Hautala | 2018-05-29 |
| 9864280 | Overlay error correction | Mangesh Ashok BANGAR, Bruce E. Adams, Kelly E. Hollar, Abhilash J. Mayur, Jaujiun Chen | 2018-01-09 |