Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9860466 | Sensor with electrically controllable aperture for inspection and metrology systems | Yung-Ho Alex Chuang, John Fielden, David L. Brown, Jingjing Zhang, Mark Wang | 2018-01-02 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9860466 | Sensor with electrically controllable aperture for inspection and metrology systems | Yung-Ho Alex Chuang, John Fielden, David L. Brown, Jingjing Zhang, Mark Wang | 2018-01-02 |