Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9734572 | System and method for defect analysis of a substrate | Chi-Hung Liao, Ming-Yi Lee | 2017-08-15 |
YT
Yao-Wei Tien
Overall (2017): #190,999 of 506,227Top 40%
1
Patents 2017