Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9734572 | System and method for defect analysis of a substrate | Yao-Wei Tien, Chi-Hung Liao | 2017-08-15 |
ML
Ming-Yi Lee
Overall (2017): #306,845 of 506,227Top 65%
1
Patents 2017