Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9734572 | System and method for defect analysis of a substrate | Yao-Wei Tien, Ming-Yi Lee | 2017-08-15 |
CL
Chi-Hung Liao
Overall (2017): #462,626 of 506,227Top 95%
1
Patents 2017