Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9733200 | Defect judging device, radiography system, and defect judging method | Kiichi Sugimoto, Yosuke Fujitomi, Tsuyoshi Tomita, Atsushi Kiya, Akemi Takano | 2017-08-15 |
| 9685549 | Nitride semiconductor device and method for manufacturing same | Hideyuki Okita, Yasuhiro Uemoto, Masahiro Hikita, Takahiro Sato, Akihiko Nishio | 2017-06-20 |