Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9733200 | Defect judging device, radiography system, and defect judging method | Kiichi Sugimoto, Yosuke Fujitomi, Tsuyoshi Tomita, Atsushi Kiya, Hidenori Takeda | 2017-08-15 |
AT
Akemi Takano
Overall (2017): #500,154 of 506,227Top 100%
1
Patents 2017