Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9733200 | Defect judging device, radiography system, and defect judging method | Kiichi Sugimoto, Yosuke Fujitomi, Atsushi Kiya, Akemi Takano, Hidenori Takeda | 2017-08-15 |
TT
Tsuyoshi Tomita
Overall (2017): #208,810 of 506,227Top 45%
1
Patents 2017