Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9824946 | Test architecture of semiconductor device, test system, and method of testing semicondurctor devices at wafer level | Ho-Sung Song, Chi-Wook Kim | 2017-11-21 |
| 9601179 | Semiconductor memory device, method of performing a refresh for semiconductor memory device and refresh counter in semiconductor memory device | Whi-Young Bae | 2017-03-21 |